Login (DCU Staff Only)
Login (DCU Staff Only)

DORAS | DCU Research Repository

Explore open access research and scholarly works from DCU

Advanced Search

Correlation of Raman and X-Ray Diffraction Measurements of Annealed Pulsed Laser Deposited ZnO Thin Films.

Roy, C., Byrne, Sarah, McGlynn, Enda orcid logoORCID: 0000-0002-3412-9035, Mosnier, Jean-Paul orcid logoORCID: 0000-0002-9312-1754, de Posada, Eduardo, O'Mahony, Donagh, Lunney, James G., Henry, Martin O., Ryan, Brendan and Cafolla, Attilio A. orcid logoORCID: 0000-0003-1475-3807 (2003) Correlation of Raman and X-Ray Diffraction Measurements of Annealed Pulsed Laser Deposited ZnO Thin Films. Thin Solid Films, 436 (2). pp. 273-276. ISSN 0040-6090

Abstract
Raman spectroscopy, X-ray diffractometry and atomic force microscopy have been used to characterise ZnO thin films grown by pulsed laser deposition as a function of the post-growth annealing temperature. The results show substantial enhancement and broadening of certain Raman features which correlate excellently with the change in width of the X-ray diffraction peaks. The 570 cm[-1] Raman feature showed pronounced asymmetry and enhanced intensity in the unannealed sample. An increase in grain size observed after subsequent annealing produced a substantial reduction in both the asymmetry and intensity of this peak. Our experimental data suggest that electric fields, due to charge trapping at grain boundaries, in conjunction with localised and surface phonon modes are the cause of the intensity enhancement and asymmetry of this feature.
Metadata
Item Type:Article (Published)
Refereed:Yes
Uncontrolled Keywords:transition element compounds; inorganic compounds; line broadening; raman spectra; texture; microstructure; polycrystals; thermal annealing; pulsed lasers; laser ablation technique; crystal growth from vapors; zinc oxides; II-VI semiconductors; wide band gap semiconductors; thin films; experimental study;
Subjects:Physical Sciences > Thin films
Physical Sciences > Physics
Physical Sciences > Lasers
Physical Sciences > Semiconductors
DCU Faculties and Centres:Research Initiatives and Centres > National Centre for Plasma Science and Technology (NCPST)
Research Initiatives and Centres > National Centre for Sensor Research (NCSR)
DCU Faculties and Schools > Faculty of Science and Health > School of Physical Sciences
Publisher:Elsevier
Official URL:http://dx.doi.org/10.1016/S0040-6090(03)00617-5
Use License:This item is licensed under a Creative Commons Attribution-NonCommercial-Share Alike 3.0 License. View License
ID Code:6
Deposited On:26 Oct 2006 by DORAS Administrator . Last Modified 07 Oct 2021 12:32
Documents

Full text available as:

[thumbnail of THIN_SOLID_FILMS_REVISED_2003.pdf]
Preview
PDF - Requires a PDF viewer such as GSview, Xpdf or Adobe Acrobat Reader
389kB
Downloads

Downloads

Downloads per month over past year

Archive Staff Only: edit this record