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Advanced characterisation techniques for nanostructures

Freeland, Brian orcid logoORCID: 0000-0003-3705-5745, Ahad, Inam Ul orcid logoORCID: 0000-0002-3802-6156, Foley, Greg orcid logoORCID: 0000-0002-2284-4218 and Brabazon, Dermot orcid logoORCID: 0000-0003-3214-6381 (2017) Advanced characterisation techniques for nanostructures. In: Micro and Nanomanufacturing. Springer, Cham, Basingstoke, UK, pp. 55-93. ISBN 978-3-319-67130-7

Abstract
This chapter presents some of the most important currently utilised techniques for the characterisation of nanostructures and nanoparticles. The techniques presented here are grouped into categories of topology, internal structure and compositional investigation. Topological techniques presented here include field emission scanning electron microscopy (FESEM), scanning probe microscopy (SPM), optical microscopy (confocal and NSOM) and particle size distribution with dynamic light scattering (DLS). Internal structure techniques presented include transmission electron microscope (TEM), magnetic resonance force microscope (MRFM) and X-ray diffraction (XRD). Compositional techniques presented include X-ray photoelectron spectroscopy (XPS), energy dispersive X-ray spectroscopy (EDS), secondary ion mass spectroscopy (SIMS) and Auger electron spectroscopy (AES). To highlight the current capabilities and applications of these techniques, case studies from recent literature are presented.
Metadata
Item Type:Book Section
Refereed:Yes
Additional Information:https://link.springer.com/chapter/10.1007/978-3-319-67132-1_4#citeas
Subjects:UNSPECIFIED
DCU Faculties and Centres:DCU Faculties and Schools > Faculty of Engineering and Computing > School of Mechanical and Manufacturing Engineering
Research Initiatives and Centres > I-Form
Publisher:Springer, Cham
Official URL:https://doi.org/10.1007/978-3-319-67132-1_4
Copyright Information:© Springer
Use License:This item is licensed under a Creative Commons Attribution-NonCommercial-Share Alike 3.0 License. View License
ID Code:25638
Deposited On:18 Mar 2021 16:54 by Brian Freeland . Last Modified 21 Nov 2023 11:23
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